Statistics – Applications
Scientific paper
Apr 1999
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999spie.3743..162h&link_type=abstract
Proc. SPIE Vol. 3743, p. 162-168, In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufac
Statistics
Applications
Scientific paper
We have been developing cryogenic detectors for astro- particle physics applications including search for Dark Matter, neutrino physics and x-ray astronomy. Most recently we started the development of high resolution x-ray detectors based on superconducting tunnel junctions and superconducting phase transition thermometers/transition edge sensors for microanalysis applications. Both types of sensors are being investigated as well as the cryogenic setup for applications on a scanning electron microscope.
Altmann Michael
Angloher Godehard
Buehler Matthias
Frank Torsten
Hertrich Theo
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