Physics
Scientific paper
Jul 2008
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008hst..prop12046s&link_type=abstract
HST Proposal ID #12046. Cycle 17
Physics
Scientific paper
Whenever the FUV detector high voltage is on, count rate and current draw information is collected, monitored, and saved to DCE memory. Every 10 msec the detector samples the currents from the HV power supplies {HVIA, HVIB} and the AUX power supply {AUXI}. The last 1000 samples are saved in memory, along with a histogram of the number of occurrences of each current value. In the case of a HV transient {known as a "crackle" on FUSE}, where one of these currents exceeds a preset threshold for a persistence time, the HV will shut down, and the DCE memory will be dumped and examined as part of the recovery procedure. However, if the current exceeds the threshold for less than the persistence time {a "mini-crackle" in FUSE parlance}, there is no way to know without dumping DCE memory. By dumping and examining the histograms regularly, we will be able to monitor any changes in the rate of "mini-crackles" and thus learn something about the state of the detector.;
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