Combining Micro-Penetrometer and Near-Infrared Photography to Measure Physical Properties in Snow Profiles

Details Combining Micro-Penetrometer and Near-Infrared Photography to Measure Physical Properties in Snow Profiles Combining Micro-Penetrometer and Near-Infrared Photography to Measure Physical Properties in Snow Profiles

Oct 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003mpse.conf.8062m&link_type=article

Third International Conference on Mars Polar Science and Exploration, October 13-17 2003, Alberta, Canada, abstract no.8062

Physics

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