Characterization of x-ray streak cameras for use on Nova

Details Characterization of x-ray streak cameras for use on Nova Characterization of x-ray streak cameras for use on Nova

May 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.2869..680k&link_type=abstract

Proc. SPIE Vol. 2869, p. 680-685, 22nd International Congress on High-Speed Photography and Photonics, Dennis L. Paisley; Ed.

Physics

Optics

6

Scientific paper

There are many different types of measurements that require a continuous time history of x-ray emission that can be provided with an x-ray streak camera. In order to properly analyze the images that are recorded with the x-ray streak cameras operated on Nova, it is important to account for the streak characterization of each camera. We have performed a number of calibrations of the streak camera both on the bench as well as with Nova disk target shots where we use a time modulated laser intensity profile (self-beating of the laser) on the target to generate an x-ray comb. We have measured the streak camera sweep direction and spatial offset, curvature of the electron optics, sweep rate, and magnification and resolution of the electron optics.

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