Characterization of synthetic IR scene generator thermal pixel array

Details Characterization of synthetic IR scene generator thermal pixel array Characterization of synthetic IR scene generator thermal pixel array

Aug 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001spie.4366..489s&link_type=abstract

Proc. SPIE Vol. 4366, p. 489-500, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, Robert Lee Murrer; E

Physics

Scientific paper

With the increased demand for IR sensor and surveillance systems, there is a growing need for technologies to support their operational readiness. Measurement of sensor characteristics such as sensitivity, MRTD, and dynamic range should be standard in all mission critical systems. The Real-Time Infrared Test Set (RTIR) is a portable system designed to provide in-the-field calibration and testing of IR imaging systems and seekers. RTIR uses the high volume manufacturing processes of the Very Large Scale Integration and the Micro Electromechanical Systems technology to produce a Thermal Pixel Array (TPA). State-of-the-art CMOS processes define all the necessary on-chip digital and analog electronics. When properly driven, this array generates variable temperature, synthetic IR scenes. A nonuniformity measurement of several TPAs is presented.

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