Characterization of optical blacks by infrared ellipsometry and reflectometry

Details Characterization of optical blacks by infrared ellipsometry and reflectometry Characterization of optical blacks by infrared ellipsometry and reflectometry

Dec 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1331..249n&link_type=toc

Proc. SPIE Vol. 1331, p. 249-260, Stray Radiation in Optical Systems, Robert P. Breault; Ed.

Physics

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