Characterization of multilayer stack parameters from x-ray reflectivity data using the PPM program: measurements and comparison with TEM results

Physics – Optics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Scientific paper

Future hard (10-100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the reflective coatings. In order to evaluate the achievable optical performance X-Ray Reflectivity (XRR) measurements are performed, which are powerful tools for the in-depth characterization of multilayer properties (roughness, thickness and density distribution). An exact extraction of the stack parameters is however difficult because the XRR scans depend on them in a complex way. The PPM code, developed at ERSF in the past years, is able to derive the layer-by-layer properties of multilayer structures from semi-automatic XRR scan fittings by means of a global minimization procedure in the parameters space. In this work we will present the PPM modeling of some multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation. Moreover, in order to verify the predictions of PPM, the obtained results are compared with TEM profiles taken on the same set of samples. As we will show, PPM results are in good agreement with the TEM findings. In addition, we show that the accurate fitting returns a physically correct evaluation of the variation of layers thickness through the stack, whereas the thickness trend derived from TEM profiles can be altered by the superposition of roughness profiles in the sample image.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Characterization of multilayer stack parameters from x-ray reflectivity data using the PPM program: measurements and comparison with TEM results does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Characterization of multilayer stack parameters from x-ray reflectivity data using the PPM program: measurements and comparison with TEM results, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Characterization of multilayer stack parameters from x-ray reflectivity data using the PPM program: measurements and comparison with TEM results will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1620443

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.