Characterization of lambdac=5 um Hg:Cd:Te arrays for low-background astronomy

Details Characterization of lambdac=5 um Hg:Cd:Te arrays for low-background astronomy Characterization of lambdac=5 um Hg:Cd:Te arrays for low-background astronomy

Aug 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4008.1268h&link_type=abstract

Proc. SPIE Vol. 4008, p. 1268-1279, Optical and IR Telescope Instrumentation and Detectors, Masanori Iye; Alan F. Moorwood; Eds.

Physics

Instrumentation and Detectors

2

Scientific paper

Hg:Cd:Te grown by Molecular Beam Epitaxy onto a lattice matched Cd:Zn:Te substrate with Double Layer Planar Heterostructure architecture holds promise of extremely low, near theoretical dark current out to wavelengths beyond 5 micrometers while eliminating the persistent images and reduced short-wave quantum efficiency disadvantages of the liquid phase epitaxial (LPE) material now in widespread astronomical use. We report on the characterization of two Rockwell FPAs consisting of (lambda) c approximately 4.75 micrometers MBE material hybridized to 1K by 1K HAWAII multiplexers within the context of establishing their performance relative to the stringent focal plane goals for the Next Generation Space Telescope (NGST). The effort has concentrated primarily on characterizing total FPA noise at selected temperatures from 30 to 90 K although short wave quantum efficiency and image persistence have also been measured. The test procedures are based on the use of both DC and variance nosie techniques and, at T approximately 60K, have allowed characterization of the total noise as the sum of separate contributions due to dark current, read noise and read charge. The test facility and characterization techniques are described and results, which verify the remarkable potential of this material to exceed the NGST performance goals at temperatures both at, and also significantly higher than, the approximate 30K now anticipated for the NGST NIR focal pane, are presented.

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