Characterization of graded d-spacing multilayers for hard x-ray telescopes

Details Characterization of graded d-spacing multilayers for hard x-ray telescopes Characterization of graded d-spacing multilayers for hard x-ray telescopes

Nov 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3444..556i&link_type=abstract

Proc. SPIE Vol. 3444, p. 556-563, X-Ray Optics, Instruments, and Missions, Richard B. Hoover; Arthur B. Walker; Eds.

Physics

Optics

Scientific paper

The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard x-ray focusing telescopes. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular x-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

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