Characterization of bulk CdZnTe by IR transmission imaging

Details Characterization of bulk CdZnTe by IR transmission imaging Characterization of bulk CdZnTe by IR transmission imaging

Jul 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3115...51d&link_type=abstract

Proc. SPIE Vol. 3115, p. 51-55, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, Richard B. Hoover; F. Patri

Physics

Optics

1

Scientific paper

Performance and yield of CdZnTe (CZT) nuclear radiation detector arrays are sensitive to bulk defects introduced at all stages of material processing. Ingots of CZT grown by the high pressure Bridgman process contain several kinds of bulk material defects (BMDs) which can affect nuclear detector performance. In this study infrared transmission imaging was used to locate and identify certain BMDs in four-inch CZT wafers produced by Digirad. The correlation of performance of subsequently processed pixel arrays with IR image features demonstrates the predictive value of this method.

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