Characterization of a CCD array for Bragg spectroscopy

Details Characterization of a CCD array for Bragg spectroscopy Characterization of a CCD array for Bragg spectroscopy

2006-02-23

arxiv.org/abs/physics/0602159v1

Review of Scientific Instruments 77 (04/2006) 043107

Physics

Atomic Physics

Submitted to Review of Scientific Instruments

Scientific paper

10.1063/1.2194485

The average pixel distance as well as the relative orientation of an array of 6 CCD detectors have been measured with accuracies of about 0.5 nm and 50 $\mu$rad, respectively. Such a precision satisfies the needs of modern crystal spectroscopy experiments in the field of exotic atoms and highly charged ions. Two different measurements have been performed by illuminating masks in front of the detector array by remote sources of radiation. In one case, an aluminum mask was irradiated with X-rays and in a second attempt, a nanometric quartz wafer was illuminated by a light bulb. Both methods gave consistent results with a smaller error for the optical method. In addition, the thermal expansion of the CCD detectors was characterized between -105 C and -40 C.

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