Characterization and multilayer coating of cylindrical x-ray optics for x-ray astronomy

Details Characterization and multilayer coating of cylindrical x-ray optics for x-ray astronomy Characterization and multilayer coating of cylindrical x-ray optics for x-ray astronomy

Nov 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3444..552r&link_type=abstract

Proc. SPIE Vol. 3444, p. 552-555, X-Ray Optics, Instruments, and Missions, Richard B. Hoover; Arthur B. Walker; Eds.

Physics

Optics

Scientific paper

We are engaged in a program to develop focusing hard x-ray optics for future x-ray astronomy missions. Optics are being developed to focus x-rays up to and beyond 80 keV. Emphasis is on the multilayer coating of integral cylindrical optics which will provide the highest spatial resolution. A chamber geometry has been designed to allow the uniform coating of the inside surface of integral cylinders. The building and testing of this system has taken place over the past year. Linear DC magnetron cathodes are used to sputter the multilayer films. Initial results from both longitudinal and azimuthal uniformity coating tests are presented.

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