Calibration of the EIT instrument for the SOHO mission

Details Calibration of the EIT instrument for the SOHO mission Calibration of the EIT instrument for the SOHO mission

Oct 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995spie.2517...29d&link_type=abstract

Proc. SPIE Vol. 2517, p. 29-39, X-Ray and EUV/FUV Spectroscopy and Polarimetry, Silvano Fineschi; Ed.

Physics

Optics

1

Scientific paper

Optical characteristics in the wavelength range 15 - 75 nm of the EUV
imaging telescope to be launched soon on the SOHO mission are discussed.
Bandpasses and photometric sensitivity of the multilayered optics
telescope have been measured by a dedicated synchrotron light source at
Orsay, France.

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