Beam Test Results for Fine Pitched Multigeometry Silicon Strip Detectors

Details Beam Test Results for Fine Pitched Multigeometry Silicon Strip Detectors Beam Test Results for Fine Pitched Multigeometry Silicon Strip Detectors

Apr 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010apsp.conf..858k&link_type=abstract

ASTROPARTICLE, PARTICLE AND SPACE PHYSICS, DETECTORS AND MEDICAL PHYSICS APPLICATIONS. Proceedings of the 11th Conference. Held

Physics

Medical Physics

Scientific paper

In order to test a variety of strip geometries at once, a multi-geometry sensor was designed and tested with 120 GeV pions at SPS. Its 16 zones vary in strip-to-pitch ratio and the number of intermediate strips. The data analysis aimed to quantify the zone properties with respect to the particle incidence angle and an estimate of the achievable resolutions for all sensor zones was derived. A matter of particular interest is the investigation of cluster width distributions at different incidence angles. They allow one to draw conclusions about the feasibility and the efficiency of pτ-trigger modules, which use only the cluster width to infer the particle's transverse momentum.

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