Bayesian inference of nanoparticle-broadened x-ray line profiles

Details Bayesian inference of nanoparticle-broadened x-ray line profiles Bayesian inference of nanoparticle-broadened x-ray line profiles

2003-05-06

arxiv.org/abs/physics/0305018v1

Physics

Data Analysis, Statistics and Probability

43 pages, 13 Figures, 5 Tables

Scientific paper

A single and self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO$_{2}$ data. The results demonstrate that the proposed method can determine size distributions, while making the least number of assumptions. The comparison of the Bayesian/MaxEnt results from experimental CeO$_2$ with TEM results is favorable

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