Balanced homodyne detection in second-harmonic generation microscopy

Details Balanced homodyne detection in second-harmonic generation microscopy Balanced homodyne detection in second-harmonic generation microscopy

2006-04-15

arxiv.org/abs/physics/0604125v2

Applied Physics Letters 89 (2006) 121118

Physics

Optics

9 pages to appear in Applied Physics Letters

Scientific paper

10.1063/1.2356375

We demonstrate the association of two-photon nonlinear microscopy with balanced homodyne detection for investigating second harmonic radiation properties at nanoscale dimensions. Variation of the relative phase between second-harmonic and fundamental beams is retrieved, as a function of the absolute orientation of the nonlinear emitters. Sensitivity down to approximately 3.2 photon/s in the spatio-temporal mode of the local oscillator is obtained. This value is high enough to efficiently detect the coherent second-harmonic emission from a single KTiOPO4 crystal of sub-wavelength size.

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