Physics – Optics
Scientific paper
Oct 1997
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3121..434l&link_type=abstract
Proc. SPIE Vol. 3121, p. 434-444, Polarization: Measurement, Analysis, and Remote Sensing, Dennis H. Goldstein; Russell A. Chipm
Physics
Optics
Scientific paper
The backscattering Mueller matrices for a range of bead- blasted aluminium samples having a range of surface roughness and slopes are investigated using a 632.8nm linearly polarized HeNe laser. The analyzing polarizing optics and detector are fixed in the backscattering direction and the angle of incidence varied from 0 degrees to 90 degrees. A computer controlled Mueller matrix scatterometer determines the matrix elements. The incident polarization states are set via combinations of a polarizer and waveplates and the backscattered light is Fourier analyzed using a rotating compensator and fixed linear polarizer. The surfaces were characterized using a surface profilometer and the variation of the Mueller matrix elements with incidence angle determined. Only four elements of the normalized Mueller matrix are non-zero. Of these, three vary with incidence angle and the fourth is normalized to unity. A depolarization term P(subscript D) calculated from the matrix elements is shown to decrease with increasing angle of incidence. Its value at normal incidence reduces with increasing bead-blast pressure.
Jordan David L.
Lewis Gareth D.
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