Backreflection measurements on the SILEX telescope

Details Backreflection measurements on the SILEX telescope Backreflection measurements on the SILEX telescope

May 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1522..252b&link_type=abstract

In: Optical space communication II; Proceedings of the Meeting, Munich, Germany, June 10, 11, 1991 (A93-32077 12-17), p. 252-258

Physics

Laser Beams, Optical Communication, Optical Reflection, Satellite Communication, Space Communication, Telescopes, Design Analysis, Semiconductor Lasers

Scientific paper

The SILEX telescope breadboard model is used to conduct back-reflection measurements which could be analyzed to determine the characteristics of a simultaneous transmitting and receiving of laser signals, such as would be encountered in an optical intersatellite communication link terminal. Back-reflection is found to come primarily from the collimator lenses and the secondary mirror surface; at the edge of the useful wavelength band, the back-reflection ratio is 40 percent above the permissible value, due to the wavelength dependence of the lens antireflection coating.

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