Atom lithography using MRI-type feature placement

Physics – Atomic Physics

Scientific paper

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4 pages, 4 figures

Scientific paper

10.1088/1367-2630/7/1/047

We demonstrate the use of frequency-encoded light masks in neutral atom lithography. We demonstrate that multiple features can be patterned across a monotonic potential gradient. Features as narrow as 0.9 microns are fabricated on silicon substrates with a metastable argon beam. Internal state manipulation with such a mask enables continuously adjustable feature positions and feature densities not limited by the optical wavelength, unlike previous light masks.

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