Atom chips in the real world: the effects of wire corrugation

Details Atom chips in the real world: the effects of wire corrugation Atom chips in the real world: the effects of wire corrugation

2004-07-17

arxiv.org/abs/physics/0407094v4

European Physical Journal D 32 (2005) 171-180

Physics

Atomic Physics

Scientific paper

10.1140/epjd/e2005-00016-x

We present a detailed model describing the effects of wire corrugation on the trapping potential experienced by a cloud of atoms above a current carrying micro wire. We calculate the distortion of the current distribution due to corrugation and then derive the corresponding roughness in the magnetic field above the wire. Scaling laws are derived for the roughness as a function of height above a ribbon shaped wire. We also present experimental data on micro wire traps using cold atoms which complement some previously published measurements and which demonstrate that wire corrugation can satisfactorily explain our observations of atom cloud fragmentation above electroplated gold wires. Finally, we present measurements of the corrugation of new wires fabricated by electron beam lithography and evaporation of gold. These wires appear to be substantially smoother than electroplated wires.

Affiliated with

Also associated with

No associations

Rating

Atom chips in the real world: the effects of wire corrugation does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Atom chips in the real world: the effects of wire corrugation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Atom chips in the real world: the effects of wire corrugation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-12136