Astrophysical Extended X-Ray Absorption Fine-Structure Analysis

Details Astrophysical Extended X-Ray Absorption Fine-Structure Analysis Astrophysical Extended X-Ray Absorption Fine-Structure Analysis

Mar 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997apj...477..235w&link_type=abstract

Astrophysical Journal v.477, p.235

Astronomy and Astrophysics

Astronomy

12

Atomic Processes, Ism: Abundances, X-Rays: General

Scientific paper

We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2 delta 1), backscattering phase shift ( phi b), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray--absorbing atom are given.

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