Analytical electron microscopy of LDEF impactor residues

Details Analytical electron microscopy of LDEF impactor residues Analytical electron microscopy of LDEF impactor residues

Feb 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995ldef.symp..401b&link_type=abstract

In NASA. Langley Research Center, LDEF: 69 Months in Space. Third Post-Retrieval Symposium, Part 1 p 401-413 (SEE N95-23796 07-9

Physics

Earth Orbital Environments, Electron Microscopy, Impact Damage, Impact Tests, Long Duration Exposure Facility, Microanalysis, Micrometeoroids, Residues, Space Debris, Impact Tolerances, Interplanetary Dust, Low Earth Orbits, Meteorite Craters, Meteoroid Concentration, Particulates

Scientific paper

The LDEF contained 57 individual experiment trays or tray portions specifically designed to characterize critical aspects of meteoroid and debris environment in low-Earth orbit (LEO). However, it was realized from the beginning that the most efficient use of the satellite would be to characterize impact features from the entire surface of the LDEF. With this in mind particular interest has focused on common materials facing in all 26 LDEF facing directions; among the most important of these materials has been the tray clamps. Therefore, in an effort to better understand the nature and flux of particulates in LEO, and their effects on spacecraft hardware, we are analyzing residues found in impact features on LDEF tray clamp surfaces. This paper summarizes all data from 79 clamps located on Bay A & B of the LDEF. We also describe current efforts to characterize impactor residues recovered from the impact craters, and we have found that a low, but significant, fraction of these residues have survived in a largely unmelted state. These residues can be characterized sufficiently to permit resolution of the impactor origin. We have concentrated on the residue from chondritic interplanetary dust particles (micrometeoroids), as these represent the harshest test of our analytical capabilities.

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