Analysis of tracks in the stacked film track detector

Details Analysis of tracks in the stacked film track detector Analysis of tracks in the stacked film track detector

Dec 1984

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1984nimpa.227..561h&link_type=abstract

Nuclear Instruments and Methods in Physics Research Section A, Volume 227, Issue 3, p. 561-564.

Physics

1

Scientific paper

A method to analyze the experimental data of a plastic track detector is presented. The charge distribution obtained for the cosmic ray heavy charged particles is shown, and it is used to criticize theories which have been proposed until now to explain the rate of chemical etching along ion tracks. The primary ionization J and the restricted energy loss REL are evaluated and compared at the same etching velocity for various charges.
REL fits the etching rate well only for light elements Z < 15, and J is suitable either for Z < 15 or Z > 15, while overall fitting is not possible for either theory. The fine structures of the curves, REL, J, and (Z*/β)2 vs Z, serve as a measure to estimate the real mean atomic mass of each element in cosmic rays.

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