Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV

Details Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV

Jul 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2805..311f&link_type=abstract

Proc. SPIE Vol. 2805, p. 311-322, Multilayer and Grazing Incidence X-Ray/EUV Optics III, Richard B. Hoover; Arthur B. Walker; Ed

Physics

Optics

Scientific paper

For the best flexibility in ground and on-orbit calibration modeling of the AXAF telescope over its entire field of view, including off-axis calibration evaluations, AXAF synchrotron reflectance calibrations require that the measured reflectance data be reduced to optical parameters analogous to n and k. We have developed a method for AXAF witness mirror analysis which is a modification of the NKFIT optical constants algorithm published by D.L. Windt. The algorithm assumes uniform layer thicknesses using a recursive, exact formation of Fresnel's equations, with a modified Debye-Waller roughness correction factor. The recursion formula has been modified to include an explicit double-precision formulation. The results of most of the fits of AXAF calibration measurements yield residuals less than 1 percent of the reflectance value levels down to R approximately .03. The precision of the measurements is smaller still, which compromises the (chi) (superscript 2) fitting algorithm; however, the results will most likely prove adequate for AXAF witness mirrors calibrated in the 5-12 keV range. Coating density determined from the refractive index n is approximately 98.5 percent of the bulk for iridium. Derived coating thicknesses are extremely consistent with the photon energy, giving still more significant calibration information to the program.

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