Analysis of Genesis Sample Surface Contamination by Total Reflection X-Ray Fluorescence Spectrometry

Details Analysis of Genesis Sample Surface Contamination by Total Reflection X-Ray Fluorescence Spectrometry Analysis of Genesis Sample Surface Contamination by Total Reflection X-Ray Fluorescence Spectrometry

Mar 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010lpi....41.1682s&link_type=abstract

41st Lunar and Planetary Science Conference, held March 1-5, 2010 in The Woodlands, Texas. LPI Contribution No. 1533, p.1682

Physics

1

Scientific paper

Laboratory based TXRF has been used to analyze Genesis flight samples
for surface contamination. After initial cleaning substantial
contaminations remained but additional acid cleaning could remove most
of these.

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