Analysis of ellipsometric data obtained from curved surfaces

Details Analysis of ellipsometric data obtained from curved surfaces Analysis of ellipsometric data obtained from curved surfaces

2011-09-05

arxiv.org/abs/1109.0892v1

Physics

Optics

10 pages, 8 figures

Scientific paper

This article deals with quantitative error analysis resulting from ellipsometric data obtained from measurement on curved surfaces including the influence of non-collimated beams. Numerical model based on the combination of geometrical and wave optics is restricted to the example of single dielectric layer deposited on the substrate with complex index of refraction. Three methods for averaging measurable ellipsometric data are compared.

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