Analysis of Cd1-xZnxTe microstructure

Details Analysis of Cd1-xZnxTe microstructure Analysis of Cd1-xZnxTe microstructure

Jul 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3115...40h&link_type=abstract

Proc. SPIE Vol. 3115, p. 40-50, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, Richard B. Hoover; F. Patri

Physics

Optics

1

Scientific paper

The microstructure and chemical inhomogeneities of commercially available Cd(subscript 1-x)Zn(subscript x)Te (CZT) have been evaluated using electron microscopy and microanalytical techniques. Since imperfections, such as inclusions, cracks and extended crystallographic defects are known to affect the performance of CZT gamma-ray spectrometers, understanding the nature and origins of such imperfections is vital to the improvement of device performance. CZT that is grown using a high-pressure Bridgeman method has a polycrystalline microstructure containing numerous grain boundaries, twins and inclusions. In this study, scanning electron microscopy and x- ray energy-dispersive spectroscopy were used to analyze inclusions and cracks inside CZT material. Such analysis found regions of material rich in C, O, Si, Zn, and Te. Transmission electron microscopy revealed small subgrains and thin platelets of a second phase material located inside the large- grain CZT matrix. Details of these microstructural features and their possible origins are discussed.

Affiliated with

Also associated with

No associations

Rating

Analysis of Cd1-xZnxTe microstructure does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Analysis of Cd1-xZnxTe microstructure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analysis of Cd1-xZnxTe microstructure will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1417354