An X-Ray Diffraction Study of Inclusions in Allende Using a Focussed X-Ray MicroSource

Details An X-Ray Diffraction Study of Inclusions in Allende Using a Focussed X-Ray MicroSource An X-Ray Diffraction Study of Inclusions in Allende Using a Focussed X-Ray MicroSource

Mar 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003lpi....34.1734m&link_type=abstract

34th Annual Lunar and Planetary Science Conference, March 17-21, 2003, League City, Texas, abstract no.1734

Physics

Scientific paper

We analysed samples of DI, CAI, and matrix from Allende using an XRD
system that employs a high-brightness X-ray generator. With appropriate
standards it will be possible to quantify mineral abundance in milligram
samples of meteoritic material.

Affiliated with

Also associated with

No associations

Rating

An X-Ray Diffraction Study of Inclusions in Allende Using a Focussed X-Ray MicroSource does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with An X-Ray Diffraction Study of Inclusions in Allende Using a Focussed X-Ray MicroSource, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and An X-Ray Diffraction Study of Inclusions in Allende Using a Focussed X-Ray MicroSource will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1856757