An optical fiber-taper probe for wafer-scale microphotonic device characterization

Details An optical fiber-taper probe for wafer-scale microphotonic device characterization An optical fiber-taper probe for wafer-scale microphotonic device characterization

2007-02-09

arxiv.org/abs/physics/0702079v1

Physics

Optics

8 pages, 5 figures, for high-res version see http://copilot.caltech.edu/publications/index.htm

Scientific paper

10.1364/OE.15.004745

A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3x10^6) and a planar microring (Q = 4.8x10^6).

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