Advances in multilayer X-ray/EUV optics - Synthesis, performance, and instrumentation

Details Advances in multilayer X-ray/EUV optics - Synthesis, performance, and instrumentation Advances in multilayer X-ray/EUV optics - Synthesis, performance, and instrumentation

Jul 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990opten..29..711b&link_type=abstract

Optical Engineering (ISSN 0091-3286), vol. 29, July 1990, p. 711-720.

Physics

Optics

8

Extreme Ultraviolet Radiation, Laminates, Optical Equipment, Reflecting Telescopes, X Ray Imagery, Cassegrain Optics, Monochromators, Optical Reflection

Scientific paper

This paper describes multilayer structures as optic elements and reviews the current status of multialyer optics for the X-ray, soft X-ray, and EUV wavelengths. Specific advances in multilayer optics are considered with special attention given to multilayer diffraction gratings. Other multilayer-based instruments include multilayer-coated Schwartzchild microscopes for laser plasma diagnostics, synchrotron radiation monochromators, X-ray microprobes, and a normal incidence Cassegrain multilayer telescope.

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