Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China

Details Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China

Sep 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002spie.4919.....y&link_type=toc

Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China , by Yao, Jianquan.;Ishii, Yukihiro

Physics

Optical Fiber Detectors, Detectors, Optoelectronic Devices, Photonics, Metrology

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