Achieving and maintaining cleanliness in NIF amplifiers

Details Achieving and maintaining cleanliness in NIF amplifiers Achieving and maintaining cleanliness in NIF amplifiers

Jul 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999spie.3492..609s&link_type=abstract

Proc. SPIE Vol. 3492, p. 609-620, Third International Conference on Solid State Lasers for Application to Inertial Confinement F

Physics

Optics

2

Scientific paper

Cleanliness measurements made on AMPLAB prototype NIF laser amplifiers during assembly, cassette transfer, and amplifier operation are summarized. These measurements include particle counts from surface cleanliness assessments using filter swipe technique and from airborne particle monitoring. Results are compared with similar measurements made on the Beamlet and Nova lasers and in flashlamp test fixtures. Observations of Class 100,000 aerosols after flashlamp firings are discussed. Comparisons are made between typical damage densities on laser amplifier optics from Novette, NOVA, Beamlet, and AMPLAB.

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