Absolute X-ray yield studies from Xe-clusters with ultrashort Ti:Sa laser pulses at 2×1018 W/cm2

Details Absolute X-ray yield studies from Xe-clusters with ultrashort Ti:Sa laser pulses at 2×1018 W/cm2 Absolute X-ray yield studies from Xe-clusters with ultrashort Ti:Sa laser pulses at 2×1018 W/cm2

Apr 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002aipc..611..288n&link_type=abstract

SUPERSTRONG FIELDS IN PLASMAS: Second International Conference on Superstrong Fields in Plasmas, Second International Conference

Physics

X-Ray, Gamma-Ray, And Particle Generation, Plasma Production And Heating By Laser Beams, Laser Light Absorption In Plasmas

Scientific paper

High intensity (~2×1018 W/cm2) laser excited large Xe-clusters (105…106 atoms per cluster) have been studied concerning scaling and absolute EUV-emission in a wavelength range between 7 nm and 15 nm. Ultrashort (50 fs) pulses from a Ti:Sa multi-TW laser at 800 nm wavelength were applied in the experiments. Characterized cluster target variations in combination with different laser irradiation have been used for EUV-yield optimization. Maximum emission as a function of the backing pressure and a spatial emission anisotropy covering a factor of 2 is discussed with a simple model of the source geometry and EUV-radiation absorption. High charge states and strong x-ray yield from laser heated clusters are considered due to collisional and optical field ionization processes. Circularly polarized laser light instead of linear polarization results in a factor of 2.5 higher emission in the 11 nm to 15 nm wavelength range. This indicates the initial influence of optical field ionization for the interaction parameter range used and contrasts to collisional heating which seems to influence preferentially higher ionization states. An absolute emission efficiency at 13.4 nm of up to 0.5% in 2π sr and 2.2% bandwidth has been measured. .

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