Absolute detection efficiency of a microchannel plate detector to X rays in the 1-100 KeV energy range

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Scientific paper

There is little information in the literature on the performance of working micro-channel plate (MCP) detectors at high x-ray energies. We have measured the absolute efficiency of a microchannel-plate-intensified, subnanosecond, one dimensional imaging x-ray detector developed at LLNL in the 1 to 100 keV range and at 1.25 MeV. The detector consists of a gold photocathode deposited on the front surface of the MCP (optimized for Ni K(subscript (alpha) ) x rays) to convert x rays to electrons, an MCP to amplify the electrons, and a fast In:CdS phosphor that converts the electron's kinetic energy to light. The phosphor is coated on a fiber-optic faceplate to transmit the light out of the vacuum system. Electrostatic focusing electrodes compress the electron current out of the MCP in one dimension while preserving spatial resolution in the other. The calibration geometry, dictated by a recent experiment, required grazing incidence x rays (15.6 degree(s)) onto the MCP detector in order to maximize deliverable current. The experiment also used a second detector made up of 0.071 in. thick BC422 plastic scintillator material from the Bicron Corporation. We compare the absolute efficiencies of these two detectors in units of optical W/cm(superscript 2) into 4 (pi) per x ray W/cm(superscript 2) incident. At 7.47 keV and 900 volts MCP bias, the MCP detector delivers approximately 1400 times more light than the scintillator detector.

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