Aberrations introduced in off-axis testing of spherical surfaces

Details Aberrations introduced in off-axis testing of spherical surfaces Aberrations introduced in off-axis testing of spherical surfaces

Nov 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996opten..35.3260m&link_type=abstract

Optical Engineering 35(11), 3260-3264, Brian J. Thompson; Ed.

Physics

1

Scientific paper

It is well known that off-axis testing of a spherical surface introduces aberrations, mainly primary astigmatism. The magnitudes of these aberrations are discussed and analytically calculated. Their influence in several testing configurations is discussed. A case of particular interest is when a linear carrier fringe pattern is used in a Fizeau interferometer.

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