A two-parameter scintillation spectrometer system for measurement of secondary proton, deuteron, and triton distributions from materials under 558-MeV-proton irradiation

Details A two-parameter scintillation spectrometer system for measurement of secondary proton, deuteron, and triton distributions from materials under 558-MeV-proton irradiation A two-parameter scintillation spectrometer system for measurement of secondary proton, deuteron, and triton distributions from materials under 558-MeV-proton irradiation

Oct 1975

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1975tpss.rept.....b&link_type=abstract

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Physics

Deuterons, Protons, Scintillation Counters, Spectrometers, Particle Energy, Particle Trajectories

Scientific paper

A two-parameter scintillation spectrometer system developed and used to obtain proton, deuteron, and triton double differential cross sections from materials under 558-MeV-proton irradiation is described. The system measures both the time of flight of secondary particles over a 488-cm flight path and the energy deposited in a scintillator, 12.7 cm in diameter and 30.48 cm long. The time resolution of the system is 0.39 nsec. The calculated energy resolution based on this time resolution varies with energy from 1.6 precent to 7.75 percent for 50- and 558-MeV protons. Various systematic and statistical errors are evaluated, and the double differential cross sections for secondary proton and deutron production at 20 deg from a 2.35 g/sq cm thick beryllium target are shown as an example of the results obtainable with this system. The uncertainly in the cross sections for secondary protons varies with particle energy from approximately + or - 9 percent at 50 MeV to approximately + or - 11 percent at 558 MeV.

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