A Transmission Electron Microscope Study of Internal Subgrains in SiC-X Grains

Details A Transmission Electron Microscope Study of Internal Subgrains in SiC-X Grains A Transmission Electron Microscope Study of Internal Subgrains in SiC-X Grains

Sep 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006m%26psa..41.5333h&link_type=citations

Meteoritics & Planetary Science, Vol. 41, Supplement, Proceedings of 69th Annual Meeting of the Meteoritical Society, held Augus

Physics

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