A System for the Functional Testing and Simulation of Custom and Semicustom VLSI Chips

Details A System for the Functional Testing and Simulation of Custom and Semicustom VLSI Chips A System for the Functional Testing and Simulation of Custom and Semicustom VLSI Chips

Apr 1986

adsabs.harvard.edu/abs/1986tdapr..86..171o

The Telecommunications and Data Acquisition Progress Report, TDA PR 42-86, April-June 1986, pp. 171-180

Physics

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