A submicron precision silicon telescope for beam test purposes

Details A submicron precision silicon telescope for beam test purposes A submicron precision silicon telescope for beam test purposes

Feb 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996nimpa.372..379c&link_type=abstract

Nuclear Instruments and Methods in Physics Research Section A, v. 372, p. 379-384.

Physics

21

Scientific paper

A precise and compact silicon microstrip detector telescope designed to provide reference information for charged particle tracks has been constructed. First operation results are presented. A signal over noise ratio higher than 100 has been obtained, resulting in a spatial resolution of 1.4 μm per detector, for a readout pitch of 50 μm. At a position in the center of the telescope, a track extrapolation error of 0.7 μm can be obtained for reconstructed tracks.

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