A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques

Details A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques

2001-10-17

arxiv.org/abs/physics/0110052v1

eConf C010630 (2001) T901

Physics

Accelerator Physics

3 pages, 1 figure. The paper was presented as contribution to working group T9 at Snowmass2001

Scientific paper

In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically to the range of a few picoseconds \cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions \cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the electron bunch. In this paper we present a novel, non-invasive, single-shot approach to improve the resolution to tens of femtoseconds so that sub-millimeter bunch length can be measured.

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