A Re-evaluation of Early Solar EUV and Soft X-ray Flux Measurements

Physics – Geophysics

Scientific paper

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7509 Corona, 7538 Solar Irradiance, 7549 Ultraviolet Emissions, 7594 Instruments And Techniques

Scientific paper

Measurements of the solar extreme ultraviolet and soft X-ray spectrum made at the (then) Air Force Geophysics Laboratory (AFGL) by a group under the direction of Hans Hinteregger were the basis for early estimates of the solar flux in the spectral range of 5 to 190 nm. Subsequent studies have indicated a discrepancy between the fluxes reported at the lower end of this spectral range and those required in modeling the Earth's ionosphere. We have examined a possible systematic source of error in the original calibration between 25 nm and 120 nm, the range over which the photoelectric yield of a tungsten surface was the basis for calibration. We find differences (never greater than 30 percent) between the adopted photoelectric yield values as a function of wavelength and measurements made elsewhere. Suggested corrections to EUV fluxes due to these deviations will be presented. To extend the analysis of AFGL results below 25 nm, but only for a period of intermediate solar activity, we use an OSO-5 spectrum between 2.5 and 40 nm having a spectral resolution of 0.05 nm. This spectrum was calibrated in-orbit using coronal density-insensitive emission line ratios and absolute flux measurements at 30.4 nm made independently by an instrument on OSO-4. These data provide independent measurements of solar fluxes in the 3-40 nm region that can be compared with AFGL observations and more recent measurements and flux models for moderate levels of solar activity.

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