A novel method for unambiguous ion identification in mixed ion beams extracted from an EBIT

Details A novel method for unambiguous ion identification in mixed ion beams extracted from an EBIT A novel method for unambiguous ion identification in mixed ion beams extracted from an EBIT

2006-06-22

arxiv.org/abs/physics/0606195v1

Physics

Atomic Physics

8 pages, 5 figures

Scientific paper

10.1063/1.2238856

A novel technique to identify small fluxes of mixed highly charged ion beams
extracted from an Electron Beam Ion Trap (EBIT) is presented and practically
demonstrated. The method exploits projectile charge state dependent potential
emission of electrons as induced by ion impact on a metal surface to separate
ions with identical or very similar mass-to-charge ratio.

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