A New In Situ Method of Determining Relative Abundances and Charge States of Implanted Transition Metals in Individual Grains Using Synchrotron X-Ray Fluorescence

Details A New In Situ Method of Determining Relative Abundances and Charge States of Implanted Transition Metals in Individual Grains Using Synchrotron X-Ray Fluorescence A New In Situ Method of Determining Relative Abundances and Charge States of Implanted Transition Metals in Individual Grains Using Synchrotron X-Ray Fluorescence

Mar 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007lpi....38.1128k&link_type=abstract

38th Lunar and Planetary Science Conference, (Lunar and Planetary Science XXXVIII), held March 12-16, 2007 in League City, Texas

Physics

1

Scientific paper

We report on a new in situ method of determining relative abundances and
charge states of implanted transition metals in individual grains using
synchrotron X-ray fluorescence.

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