A new deconvolution method applied to the Si II (1) lines profiles

Details A new deconvolution method applied to the Si II (1) lines profiles A new deconvolution method applied to the Si II (1) lines profiles

Jan 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997aipc..386..155l&link_type=abstract

The 13th international conference on spectral line shapes. AIP Conference Proceedings, Volume 386, pp. 155-156 (1997).

Computer Science

Line Shapes, Widths, And Shifts, Zeeman And Stark Effects, Optical Measurements, Abundances, Chemical Composition

Scientific paper

Biraud's method of deconvolution is applied for the first time in spectroscopy to unfold the λ 3862, 3856, and 3854 Å lines profiles. The emitting plasma is generated in a diaphragm shock tube. The test gas is Neon plus a small admixture of Tetramethylsilane. Temperature from 11,000 to 14,500 K and electron densities from 0.5 to 2.0×1023 m-3, are achieved in the radiation cooling region behind the reflected shock wave. Electron densities are determined with a two-wavelength (4880 and 6328 Å), two phase Michelson interferometer with photoelectric detection.

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