A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM)

Details A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM) A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM)

Jun 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998gecoa..62.1919e&link_type=ejournal

Geochimica et Cosmochimica Acta, v. 62, p. 1919-1923.

Physics

2

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