A High Sensitivity, High Spatial Resolution TOF-SIMS Instrument with Laser Photoionization for the Study of Interstellar Grains

Details A High Sensitivity, High Spatial Resolution TOF-SIMS Instrument with Laser Photoionization for the Study of Interstellar Grains A High Sensitivity, High Spatial Resolution TOF-SIMS Instrument with Laser Photoionization for the Study of Interstellar Grains

Jul 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003m%26psa..38.5129t&link_type=article

Meteoritics & Planetary Science, vol. 38, Supplement, abstract no.5129

Physics

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