A controlled-NOT gate in a chain of qubits embedded in a spin field-effect transistor and its process tomography

Physics – Quantum Physics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

7 pages, 3 figures

Scientific paper

We have investigated the realizability of the controlled-NOT (CNOT) gate and characterized the gate operation by quantum process tomography for a chain of qubits, realized by electrons confined in self-assembled quantum dots embedded in the spin field-effect transistor. We have shown that the CNOT gate operation and its process tomography are performable by using the spin exchange interaction and several local qubit rotations within the coherence time of qubits. Moreover it is shown that when the fluctuation of operation time and the imperfection of polarization of channel electrons are considered as sources of decay of fidelity, the process fidelity of CNOT decreases at most 5% by the fluctuation of the operation time and its values of 0.49 and 0.72 are obtained for polarizations of the channel spin 0.6 and 0.8, respectively.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

A controlled-NOT gate in a chain of qubits embedded in a spin field-effect transistor and its process tomography does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with A controlled-NOT gate in a chain of qubits embedded in a spin field-effect transistor and its process tomography, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and A controlled-NOT gate in a chain of qubits embedded in a spin field-effect transistor and its process tomography will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-64118

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.