A comparison of radiation damage in liner ICs from cobalt-60 gamma rays and 2.2-MeV electrons

Details A comparison of radiation damage in liner ICs from cobalt-60 gamma rays and 2.2-MeV electrons A comparison of radiation damage in liner ICs from cobalt-60 gamma rays and 2.2-MeV electrons

Sep 1983

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1983crdl.book.....g&link_type=abstract

Unknown

Computer Science

Amplifiers, Cobalt 60, Compton Effect, Data Processing, Gamma Rays, Radiation Damage, Earth (Planet), Jupiter (Planet), Nuclear Power Plants, Radiation Belts, Surface Ionization, Tables (Data)

Scientific paper

The total ionizing dose response of fourteen IC types from eight manufacturers was measured using Co-60 gamma rays and 2.2-MeV electrons for exposure levels of 100 to 20,000 Gy(Si). Key parameter measurements were made and compared for each device type. The data show that a Co-60 source is not a suitable simulation source for some systems because of the generally more damaging nature of electrons as well as the unpredictable nature of the individual device response to the two types of radiations used here.

Affiliated with

Also associated with

No associations

Rating

A comparison of radiation damage in liner ICs from cobalt-60 gamma rays and 2.2-MeV electrons does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with A comparison of radiation damage in liner ICs from cobalt-60 gamma rays and 2.2-MeV electrons, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and A comparison of radiation damage in liner ICs from cobalt-60 gamma rays and 2.2-MeV electrons will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1591666