Secondary Emission by Positive Ion Bombardment

Physics

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Scientific paper

The investigation was undertaken primarily to determine the ratio of the secondary electron current to the primary ion current, isip, for mercury ions bombarding a mercury target. The beam constituted a source of continually renewed surface of the target material. By varying the electron accelerating potential in the ion source, the proportions of the various types of ions present in the beam were altered. Thus the influence of mercury ions having different charges upon the secondary electron yield was determined. Some work was also done with cadmium ions bombarding a cadmium target. Singly charged mercury ions formed by electrons of up to 27 v in the ion source gave a secondary emission coefficient, γ, ranging from 1.2 percent at 4.2 kev to 4.8 percent at 9.2 kev. For electron accelerating potentials of 73 v, 110 v, and 430 v, ratios isip were determined. At 430 v, isip varied from 3.2 percent at 1.2 kv to 11 percent at 9.2 kv. Estimates were made of γ for Hg2+ and Hg3+ ions. In the case of cadmium, the electron accelerating potential was maintained at 450 v. Here isip was exceedingly high for an untreated target, varying from 35 percent at 1.5 kv to 190 percent at 7.3 kv. Renewing the surface of the cadmium target by an additional source of cadmium vapor resulted in some reduction of isip.

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