Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system

Details Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system

Feb 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2011..428p&link_type=abstract

Proc. SPIE Vol. 2011, p. 428-437, Multilayer and Grazing Incidence X-Ray/EUV Optics II, Richard B. Hoover; Arthur B. Walker; Eds

Physics

Optics

Scientific paper

This paper describes a new visible light photometer system and presents the results of a test program where visible light transmission has been measured for a variety of materials of varying thicknesses. From these measurements, equivalent absorption coefficients are presented for some of the materials commonly used in x-ray and extreme ultraviolet filters. Also presented are some criteria for quantifying light leaks through pinholes.

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